Agilent ICP-OES Model 5100 SVDV

Description

ICP-OES Model 5100 SVDV allows the detection of trace elements in the samples. Model 5100 SVDV has the advantages of simultaneous measurement of axial and radial views of the plasma. The setup includes additional easy fit torch- air inlet filter- wavelength calibration solution- tubes- exhaust system- water chiller- UPS.

Specification

Instrument specifications are provided on labs portal: https://labs.masdar.ac.ae/index.php/equipment-portal

Access And Usage

AccessLevel
Full Access
Availability
In Use