X-Ray Diffractometer

Description

X-ray diffraction (XRD) is a powerful nondestructive technique for characterizing crystalline materials. It provides information on structures, phases, preferred crystal orientations (texture), and other structural parameters, such as average grain size, crystallinity, strain, and crystal defects. X-ray diffraction peaks are produced by constructive interference of a monochromatic beam of x-rays scattered at specific angles from each set of lattice planes in a sample. The peak intensities are determined by the distribution of atoms within the lattice. Consequently, the x-ray diffraction pattern is the fingerprint of periodic atomic arrangements in a given material.

Categories

Analytical Instrument , Laboratory Equipment , Diffraction ,

Access And Usage

AccessLevel
Restricted
Training Required
Yes, specialized training is required
Training Provided
Yes, we can arrange the appropriate training

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